47:30 duration 47 minutes 30 seconds
Tech Talk Tuesday: Internal Photoemission…
Tech Talk Tuesday: Internal Photoemission Spectroscopy Measurement of Energy Barrier Heights at Interfaces of ALD Materials in Metal/Insulator/Metal (MIM) Device Structures
J.F. Conley, Jr., ProfessorSchool of Electrical Engineering and Computer ScienceOregon State University November 10, 2020 AbstractMetal-insulator-metal (MIM) devices find application as high-speed…