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Tech Talk Tuesday: Internal Photoemission Spectroscopy Measurement of Energy Barrier Heights at Interfaces of ALD Materials in Metal/Insulator/Metal (MIM) Device Structures

J.F. Conley, Jr., ProfessorSchool of Electrical Engineering and Computer ScienceOregon State University November 10, 2020 AbstractMetal-insulator-metal (MIM) devices find application as high-speed…

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